Molecular Orbital Simulations
Chem Office; Computer Added Chemistry (CACHE); Gaussian Ver. 03 and 09.
Design of Photo-functional materials;Molecular Orbital calculation (HOMO and LUMO);Structural Optimization;Simulation of FTIR, NMR, Circular Dichroism and Electronic Absorption spectra.

Synthesis of Functional Materials
Fume-Hood
Inorganic and organic Synthesis, Possibility of reaction under vacuum and inert atmosphere, Synthesis of organic and inorganic functional sensitizers and Measurement of Fuel cell Performance.

Rotary evaporators
反応時に使用した溶媒除去に使用する装置
減圧蒸留が可能で、真空ポンプ・冷却トラップを備えており高沸点溶媒の除去も可能

Material Characterizations
High Performance Liquid Chromatography (HPLC)
Analytical HPLC equipped with UV and Photodiode Array detectors; Characterization of intermediates, impurities and final products. Determination of purity of final products. Utilization of PDA detector allows the real monitoring of impurities and products by simultaneous measurement of electronic absorption spectra.

Liquid Chromatography-Mass Spectrometry (LC-MS)
Equipped with ESI and APCI probes for fast detection of mass fragments of organic molecules with various polarities. Simultaneous detection of positive and negative ion mode. Used for identification of intermediates and final products by mass analysis.

Gas Chromatography (GC)
島津製作所
Instrument used for detection and identification intermediates and products in the gas phase.

Electronic Absorption Spectroscopy
[V-570, V550, JASCO]
Instrument used for measurement absorption spectra in UV-visible and infra-red wavelength region. Possible to use both of solid and liquid samples. Used characterization of materials based on there characteristic electronic transitions qualitatively as well as quantitatively.


Fourier Transform Infrared Spectroscopy (FT-IR)
FT/IR-4100, JASCO
Used for characterization of molecules based their characteristic bond vibration. Both solid powder and thin films can be measured in transmission mode as well as reflection (Attenuated total reflectance ATR) modes.

Fluorescence Spectrophotometer
FP-6500, JASCO
Instrument associated with measurement of Fluorescence spectra in solution and coated on film after their excitation at desired wavelength from 200-750 nm.

Time Correlated Single Photon Counting Fluorescence Lifetime Measurement (TCSPC)
Quantaurus-Tau C-11367, Hamamatsu Photonics
7 types of LED based light source for excitation, measurement from 300-800 nm, Measurement in solid and liquid state, Very compact and equipped with user friendly control and analysis software. Being used design and development of new sensitizers for solar cells. Able to measure fluorescence life-time > 100 ps.

近赤外対応ナノ秒時間分解分光測定装置
(レーザーフラッシュホトリシス)
(Time-resolved Absorption Spectroscopy, Nanosecond Laser Flash Photolysis )
ユニソク:TSP-2000SLO-NIR25
マテリアルの光吸収、発光をプローブ光としてとらえ、対象物質の高速反応を把握する装置、励起光源(ポンプ光)に短パルスYAGレーザーを使用し、OPO(光パラメトリック発振器)により任意の励起波長が選択可能、分光器による単一波長及びマルチチャンネルの自動測定が可能であり、Si及び、InGaAs光検出器で波長350~2500nmまでのプローブ光を最少OD感度0.0001で測定可能

Differential Scanning Calorimetry and Thermo-Gravimetric Analysis (DSC/TG-DTA)
DTG-60/DSC-60, Shimazu
Instruments associated with the investigation of thermal properties of materials. Currently being used for the measurement thermal stability, melting and degradation temperature and phase changes during thermal cycles

Time of Flight (TOF) Measurement
TOF-401, OPTEL
Instrument dedicated for investigation of photocarrier transport in photofunctional materials. Estimation of carrier mobility, Field dependence of the carrier mobility and temperature dependence of the carrier mobility.

Thermally Stimulated Current (TSC)
TS-FETT, Rigaku
This system is capable of measuring the very small current in the range of Femto-ampere resulting from the change of the trap States due to differences of crystal defects and impurities. Out put current associated with Escape of the trap is closely related with sub-surface impurity States and defects. Such measurements provide the information of micro structure and electronic States by analysis of the trap profile in the material.

Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D)
QCM-D E1, Q-Sens
This system is capable of simultaneous measurement of QCM resonance frequency as well as dissipation or damping of its oscillations during the adsorption of molecules on the sensor surfaces, quantatitavely. By frequency change, we can determine amount of deposited materials while the by the dissipation monitoring we can have information about the viscoelasticity leading to information about the molecular rigidity or softness on the surface.

Contact Angle Meter
DCA-VZ, Kyowa
Measure the wettability, permeability, water repellency, adhesion, etc. of Liquid-solid interface.

Device Fabrication Process
Inert Atmosphere Glovebox System
UNILab, MBrown
This system is being used for device fabrication under inert atmosphere having precisely controlled oxygen (<0.1 ppm) and moisture (<1 ppm). This system is connected with the 8 source thermal evaporation system leading to complete fabrication and sealing of the device under inert atmosphere.

Simple Glaobe Box
(Glovebox)
As one
Simple compact glove box for purge gas replacement. Spin coating and drying of materials requiring humidity control are performed in a box.

Thermal Evaporation System
E-200, ALS Technology
Left hand side is 8 source thermal evaporation system with load and lock capability. Any kind of organic and inorganic materials can be successfully deposited with dual thickness monitoring.

Vacuum Evaporation system
VPC-260, Ulvac
Resistance heating vacuum evaporation system using rotary pump and oil diffusion pump. As there many flange ports, any modification is possible.

Load-lock Sputtering System
CFS-4EP-LL, Shibaura
This is a load-lock RF sputtering apparatus having three independent surces.

Nano Vapor Spray Deposition
STS-200
This is special type of nano-vapor spray deposition system containing computer controlled nozzle and stage movements. It has a two nozzles enabling the simultaneous coating of two different materials. The temperature of the substrate holding stage can be controlled from room temperature to 500oC. Un spin coater with 90 % material wastage, this system has very high (about 90 %) material utilization.

Arc Plasma Deposition System
アルバック:APDT-1S
パルスアーク放電により、Arなどのプロセスガスを使用せずにターゲットにプラズマを発生させる。基板温度を上昇させずにイオン化された蒸着粒子を平坦かつ均一な薄膜で形成することが可能

Nanofiber Electospinning Unit
KatoTech
The syringe tip is positive electrode, the substrate is placed on a flat negative electrode, and a high voltage of kV order is applied between the two electrodes. As a result, charged partocles and polymer are released from the syringe and attracted to the negative alectrode to form a fibrous film on the substrate.

Screnn-printing Machine
ニューロング精密工業:DP-320
卓上タイプの自動塗工印刷機

Manual Printing Machine
ミタニマイクロニクス:MEC-2400
メタルマスクを使用したスキージ塗布や、メッシュスクリーンによるスクリーン印刷を手動で行う

Spin Coater
1H-DX2(Upper left), Mikasa; MS-100(Upper right)
CZ-650(Lower left), Laurell; SC-150(Lower right)
The low viscosity ink is cast, and thin film formation and drying are simultaneously performed while rotating the substrate at high speed. Installed at multiple locations, such as in a glove box.

Nano Dip Coater
ND-0407, SDI
It is high precision dip coating machine which can precisely perform the dipping of the head up to 1 micrometer/second.

Low Pressure Plasma System
FEMTO, Diener Electronic
Soft Pressure Plasma Etching
SEDE-GE, Meiwafosis
This is basically a low pressure plasma system and can be utilized for the cleaning, activation and etching of th surface under investigation. At the same time, it can also be used for surface plasma polymerization.


UV-ozone Cleaner
UV-253, Filgen
Dry cleaning system with UV and Ozone. Decomposing organic pollitants by ultraviolet light, the active oxygen separated from the generated ozone combines with the decomposed pollutants, perform cleaning by becoming volatile substances such as carbon dioxide and water.

Muffle Furnace
We can perform programmed heating for different materials from RT to 1000oC. In our laboratory it is mainly being used for preparation metal-oxides electrodes like TiO2, SnO2, WO3 to fabricate the photoanodes of the dye-sensitized solar cells.

Water Purification System
PURELAB Prima and flex, ELGA
Used in synthesis and washing.

Compact Roll Press Machine
テスター産業:SA-601
ロール間距離調節方式の、ロールプレス機
圧延、圧着に使用

Precision Saws
BUEHLER:アイソメット1000
ホイールダイヤモンドソーで、樹脂・金属・セラミックを精密切断することが可能、SEM観察試料作製などに使用する

Ultra Apex Mill
UAM015
This machine is being used for the fabrication of homogenous slurry of the nanoparticles to prepare the high quality screen printable paste for the fabrication of dye-sensitized solar cells.

Device Evaluation
2 Light Sources Solar Simulator and Spectral Response Measurment
CEP-2000SRR, JIS C 8942 Class MA, Bunkoukeiki
This is an up-gradation of the Integrated solar simulator 8912 A. It can measure IPCE in the wavelength region of 300-1700 nm. Another advancement is that for the same device, it can measure the diffuse reflectance allowing the measurement of the internal quantum efficiency (IQE) of the solar cells also.

Solar Simulator and Spectral Response Measurment
CEP-2000, JIS C8912 Class A, Bunkoukeiki
This is single point solution for photovoltaic characterization of solar cells equipped with measurement for both of the I-V characteristics and Incident photon to current conversion efficiency (IPCE) also known as Photo-action spectrum. It is capable of measuring the IPCE from 300-1100 nm.

Solar Simulator
General purpose solar simulator having light irradiation at AM 1.5 condition. This can measure I-V characteristics of the larger samples is also coupled with the EIS system for interfacial resistance measurement also.

Fiber type Solar Simulator
This is compact solar simulator where light source with AM 1.5 irradiation is connected with optical fiber. This can be installed inside the glove box also for the measurement of I-V characteristics of solar cells under inert atmosphere.


Fuel Cell Performance Measurement
Fuell Chem Inc:EFC-05-02
固体高分子型燃料電池(PEFC)に、燃料(水素ガス、アルコール、アンモニアなど)を供給するシステム

Electorchmeical Impedance Spectroscopy (EIS)
The left,Princeton Applied Resarch: Potentistat/Gavanostat 263A-1 and ParkinElmer:Lok-in Amp Model5210
The right, Solartron:Electrochemical Interface 1287 and FRA(Frequency Response Analyser)1252
This system is being used for DSSC and Fuel Cell research. Interfacial resistances for various interfaces in a device can be measured by this system non-destructively.

Laser Beam Induced Current (LBIC)
This system is based on two dimensional of mapping of photocurrent generated after 100 μm spot size laser light light irradiation from a He-Cd laser light source. The laser spot is positioned by computer controlled XYZ stage controller. This is being used for homogeneity of the device characteristics.

Automatic Polarization System
北斗電工:HSV-100
CV測定(再クリックボルタンメトリ)を中心とした電気化学測定を行う、ファンクションジェネレータ、ポテンショスタットを内蔵し、データ計算、モニタ出力も備えており、電圧スイープ、電圧ステップ、自然電位でのnAオーダーの測定が可能、色素増感太陽電池の電流電圧測定にも使用できる

Surface Condition Observation
Scanning Probe Microscope (SPM)
JSPM-5200, JEOL
This is powerful tool for the surface micro-structural investigations. It can be used in various modes like and includes Atomic Force Microscopy (AFM), Scanning Tunneling Electron Microscopy (STEM), Scanning Kelvin-Prove Microscopy (SKPM) etc.

Surface profiler System
Dektak 6M, Veeco
This system can be used to measure the thickness film and surface roughness. Thin Films having thickness > 50 nm be accurately measured by this system.

Scanning Electron Microscope(SEM)
日本電子:MeoScope JCM-6000
サンプルに照射した電子腺から放出される二次電子、反射電子を走査しながら測定し像を撮影する装置、30,000倍での撮影が可能で、装置起動から約3分で画像を表示できる、タッチパネル式でオートフォーカスなど直観的な操作が可能

Confocal Laser Scanning Microscop
ECLIPSE EZ-C1si, Nikon
In our laboratory, this system is being used for the three dimensional profiling of the fluorescence emission from a device using the power of microscopy, laser beam for excitation and computer controlled X,Y,Z controller. In the DSSC research, it is being used for three dimensional mapping of dye distribution of the dyes adsorbed on the nanoparticle surface.

Focus Variation with White Light Interferometer(FVWLI)
BW-501, Nikon
Three-dimentional information can be obtained by scanning the objective kens in the vertical direction using a piezo (piezoelectric element) controller and capituring the interface fringes of the white light irradiated to the sample by the imajing element. The surface profile of 0.1 nm by non-contact, step measurement is possible, and measurement can be done in a shorter time than with stylus type.

Microscopes
OLYMBX60, OLYNPUS / DS-Fi2, Nikon
General upright microscopes. Equipped with a x5 to x100 objective lens, halogen lamp light sources are mounted up and down, reflection and transmission measurements are possible, and simple polarized light observation using a condenser lens is also possible. Equipped with a high-difinition digital camera for microscopes, analysis (measurement) / management is possible from image acquisition with dedicated image processing software.
